TLM-SCAN+
Contact resistivity and more




Measuring with spatial resolution:

The classic contact resistance measurement with the transfer length method varies the distance between the fingers and evaluate a single value for contact resistivity and sheet resistance. For solar cell stripes we apply an algorithm that also extracts a single value for sheet resistance and but each a value for contact resistivity for neighbouring fingers. Because each finger may be measured various times, the avarage value is recorded.
  • Intermediate fingers are considered by their effective width
  • The shunt conductance of each finger is measured